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Measurement of Distortion Using the Moire Interferometry

Published in Optics (Volume 4, Issue 3-1)
Received: 30 March 2015     Accepted: 12 July 2015     Published: 25 July 2015
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Abstract

Image forming lens systemsdo not provide perfect images. Lens abberations can be detected with complex optical ray-tracing. A single aberration in lenses, the distortion, can be detected at the image plane with optical mapping. Therefore moiré interferometry can be adapted to detect and measure distortion. This method is adaptable by serial testing of the universal measuring cameras, projection cameras, photogrammetrical cameras, etc. The distortion of the whole image plane can be represented on one moiré image. This can be useful if the distortion is not rotationally symmetrical for example because of errors of assembly. The distortion of 1 µm regarding the focal plane can be measured by using the moiré method presented in this paper.

Published in Optics (Volume 4, Issue 3-1)

This article belongs to the Special Issue Optical Techniques for Deformation, Structure and Shape Evaluation

DOI 10.11648/j.optics.s.2015040301.14
Page(s) 14-17
Creative Commons

This is an Open Access article, distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution and reproduction in any medium or format, provided the original work is properly cited.

Copyright

Copyright © The Author(s), 2015. Published by Science Publishing Group

Keywords

Lens Aberrations, Moire Method, Distortion

References
[1] F.A.Jenkins andH.E.White, “Fundamentals of optics” 4th ed., McGraw-Hill,1976, pp 171-173.
[2] U.Untergutsch, “Fotoelektrische Verzeichnungsmeßung an MSP-4 Objektiven”, Feingerätetechnik 29, 1980 H. 4.
[3] L.A.Sayce, “Gratings in metrology”, Journal of Physics E: Scientific Instruments,Vol. 5. 1972, pp. 193-198.
[4] J.Menz, “Verzeichnung optischer Systeme und ihre rechnerische Berücksichtigung bei Meßaufgaben”, Feingerätetechnik 29, 1980.
[5] K.J.Gasvik, “Optical metrology”, J.Wiley & Sons, 1987.
[6] O.Kafri and I.Glatt, “The physics of moiré metrology”, John Wiley & Sons Inc.
[7] P.S.Theocaris, “Moiré fringe in strain analysis”, Pergamon Press, 1969.
[8] K.Patorski and M.Kujawinska, “Handbook of the moiré fringe technique”, Elsevier, Amsterdam, 1993.
[9] K.Wenzel and N.Tveritinova, “Shape identification using moire topography”, Periodica Polytechnica, Vol.43. No.1. 1999, pp. 47-54.
[10] A.Lohmann, “Das Moiré-Gitter als vielseitiges Testobjekt: Photoelektrische Aberrationsmessung”, Optica Acta, Vol. 6. 1959. pp. 37-41.
[11] K.Wenzel, A.Farkas, Á.Antal and Z.Musch, “Two exposure projection moiré method for measurement of forms, displacement and deformations”, Interferometry’89, Warshaw, May, 1989.
[12] M.D.Ibrahim, “Formation of unsymmetric moiré fringes and their use in moire topography”, Optics and Laser in Engineering, Vol. 3. 1982, pp. 65-72.
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  • APA Style

    K. Wenzel, Gy. Abraham, P. Tamas, A. Urbin. (2015). Measurement of Distortion Using the Moire Interferometry. Optics, 4(3-1), 14-17. https://doi.org/10.11648/j.optics.s.2015040301.14

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    ACS Style

    K. Wenzel; Gy. Abraham; P. Tamas; A. Urbin. Measurement of Distortion Using the Moire Interferometry. Optics. 2015, 4(3-1), 14-17. doi: 10.11648/j.optics.s.2015040301.14

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    AMA Style

    K. Wenzel, Gy. Abraham, P. Tamas, A. Urbin. Measurement of Distortion Using the Moire Interferometry. Optics. 2015;4(3-1):14-17. doi: 10.11648/j.optics.s.2015040301.14

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  • @article{10.11648/j.optics.s.2015040301.14,
      author = {K. Wenzel and Gy. Abraham and P. Tamas and A. Urbin},
      title = {Measurement of Distortion Using the Moire Interferometry},
      journal = {Optics},
      volume = {4},
      number = {3-1},
      pages = {14-17},
      doi = {10.11648/j.optics.s.2015040301.14},
      url = {https://doi.org/10.11648/j.optics.s.2015040301.14},
      eprint = {https://article.sciencepublishinggroup.com/pdf/10.11648.j.optics.s.2015040301.14},
      abstract = {Image forming lens systemsdo not provide perfect images. Lens abberations can be detected with complex optical ray-tracing. A single aberration in lenses, the distortion, can be detected at the image plane with optical mapping. Therefore moiré interferometry can be adapted to detect and measure distortion. This method is adaptable by serial testing of the universal measuring cameras, projection cameras, photogrammetrical cameras, etc. The distortion of the whole image plane can be represented on one moiré image. This can be useful if the distortion is not rotationally symmetrical for example because of errors of assembly. The distortion of 1 µm regarding the focal plane can be measured by using the moiré method presented in this paper.},
     year = {2015}
    }
    

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  • TY  - JOUR
    T1  - Measurement of Distortion Using the Moire Interferometry
    AU  - K. Wenzel
    AU  - Gy. Abraham
    AU  - P. Tamas
    AU  - A. Urbin
    Y1  - 2015/07/25
    PY  - 2015
    N1  - https://doi.org/10.11648/j.optics.s.2015040301.14
    DO  - 10.11648/j.optics.s.2015040301.14
    T2  - Optics
    JF  - Optics
    JO  - Optics
    SP  - 14
    EP  - 17
    PB  - Science Publishing Group
    SN  - 2328-7810
    UR  - https://doi.org/10.11648/j.optics.s.2015040301.14
    AB  - Image forming lens systemsdo not provide perfect images. Lens abberations can be detected with complex optical ray-tracing. A single aberration in lenses, the distortion, can be detected at the image plane with optical mapping. Therefore moiré interferometry can be adapted to detect and measure distortion. This method is adaptable by serial testing of the universal measuring cameras, projection cameras, photogrammetrical cameras, etc. The distortion of the whole image plane can be represented on one moiré image. This can be useful if the distortion is not rotationally symmetrical for example because of errors of assembly. The distortion of 1 µm regarding the focal plane can be measured by using the moiré method presented in this paper.
    VL  - 4
    IS  - 3-1
    ER  - 

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Author Information
  • Department of Mechatronics, Optics and Information Engineering, Faculty of Mechanical Engineering, Budapest University of Technology and Economics, Budapest, Hungary

  • Department of Mechatronics, Optics and Information Engineering, Faculty of Mechanical Engineering, Budapest University of Technology and Economics, Budapest, Hungary

  • Department of Mechatronics, Optics and Information Engineering, Faculty of Mechanical Engineering, Budapest University of Technology and Economics, Budapest, Hungary

  • Department of Mechatronics, Optics and Information Engineering, Faculty of Mechanical Engineering, Budapest University of Technology and Economics, Budapest, Hungary

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